Ticket #11273 (assigned)

Opened 6 years ago

Last modified 5 years ago

More ways of masking detectors based on defined criteria

Reported by: Martyn Gigg Owned by: Owen Arnold
Priority: critical Milestone: Release 3.6
Component: Diffraction Keywords: SSC 2015 all DiffOther
Cc: Blocked By:
Blocking: Tester:

Description (last modified by Nick Draper) (diff)

We currently have basic mechanisms for automatic masking of detectors based on e.g. thresholds.

There is interest in other automatic masking mechanisms.

Contact Pascal Manuel for more information

After gathering the specific requirements and finding what are existing algs don't do the implementation of this would be great starter tickets for new starters.

Change History

comment:1 Changed 6 years ago by Nick Draper

  • Priority changed from major to critical

Batch modify all SSC tickets to critical priority (this will also show up as an update for all those already as critical)

comment:2 Changed 6 years ago by Nick Draper

  • Status changed from new to assigned
  • Owner changed from Nick Draper to Owen Arnold
  • Description modified (diff)
  • Milestone changed from Release 3.4 to Release 3.5

comment:3 Changed 6 years ago by Owen Arnold

  • Milestone changed from Release 3.5 to Release 3.6

comment:4 Changed 5 years ago by Nick Draper

  • Keywords DiffOther added

comment:5 Changed 5 years ago by Stuart Campbell

This ticket has been transferred to github issue 12112

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